Wednesday, July 8, 2015
Kleve, Germany — July 8, 2015 —
The ability to conduct at-line micronutrient analysis using ED-XRF spectroscopy at the point of production is detailed in a new application brief from SPECTRO Analytical Instruments, available to download at http://xrf.spectro.com/micronutrient.
The brief, “At-Line Micronutrient Analysis Using ED-XRF Spectroscopy at the Point of Production” , details the significant advantages of at-line elemental analysis for product quality control and consistency in micronutrient analysis — while maximizing production throughput.
Both the recent use of inductively coupled plasma-optical emission spectrometry (ICP-OES) and alternate colorimetric methods for manufacturing quality control purposes present drawbacks for producers, according to the paper. These include the need to transport samples from the production line to a laboratory for analysis, and the lengthy time that is required for extensive sample preparation.
In contrast, the advantages of at-line elemental analysis are many. The foremost benefit, according to the brief, is that with a new-generation portable ED-XRF spectrometer, elemental analysis can performed directly on a sample and usually with little preparation — at the production line or anywhere in the plant.
In addition, the use of a new, carefully-selected ED-XRF instrument in performing at-line elemental analysis can deliver the level of accuracy previously found only in the laboratory. Moreover, the paper notes, employing at-line elemental analysis can help boost production throughput, reduce costs, and provide the manufacturing process with far more flexibility than ever before.
As a guide, the brief also provides a series of critical factors for readers to consider when specifying and comparing various at-line ED-XRF spectrometers for micronutrient analysis.
The new application brief, “At-Line Micronutrient Analysis Using ED-XRF Spectroscopy at the Point of Production”, is available for download at http://xrf.spectro.com/micronutrient. The application brief is authored by SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry.
SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.
SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.
AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with more than 15,000 colleagues at nearly 150 operating locations and sales and service operations in the United States and 30 other countries around the world.
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Notes to Editors:
- Press contacts:
- Germany: Tom Milner, Tel: +49-2821-8920
- USA: Don Goncalves, Tel: +1-781-793-9380 or email@example.com