Wednesday, November 4, 2015
Kleve, Germany — November 4, 2015
— A new white paper explains why overcoming matrix effects associated with X-ray fluorescence (XRF) analysis is critical to achieving consistent high-accuracy results. The paper, titled “Mitigating Matrix Effects with Advanced Spectra-Handling Functionality When Using XRF for High-Accuracy Elemental Analysis
,” is available to download at http://goo.gl/5tIKb9
from SPECTRO Analytical Instruments, a leading manufacturer of advanced instruments.
A great advantage of energy dispersive X-ray fluorescence (ED-XRF) analysis
for rapid screening analysis is its ability to measure samples directly with a minimum of preparation. Realizing this benefit, however, requires eliminating potential errors that can result when atoms in the sample matrix influence the fluorescence of others and thus the intensities measured by the spectrometer are influenced. Such effects, which include absorption and enhancement, when taken collectively, are referred to generally as matrix effects
. For quality control applications, when the sample matrix is known or can be matched, a variety of standards-based XRF calculation procedures are available to compensate for undesirable matrix effects.
However, creating the right basis for consistently high-accuracy results requires additional spectra handling functionality to determine the correct net intensities of the measured spectra. The new white paper, “Mitigating Matrix Effects with Advanced Spectra-Handling Functionality When Using XRF for High-Accuracy Elemental Analysis
,” explains why this additional functionality is a critical aspect of overcoming matrix effects and ensuring those consistently high-accuracy results. Download the new white paper from http://goo.gl/5tIKb9