Advantages of Simultaneous ICP-OES Elemental Analysis for Cost-Effective Condition Monitoring are Detailed in New White Paper

Wednesday, September 9, 2015

Kleve, Germany — September 9, 2015 — Spectrometer-based elemental analysis has become a fundamental technique for condition monitoring (CM) in most service laboratories. A new white paper, “Cost-Effective Condition Monitoring,” details why a simultaneous ICP-OES instrument is a serious economic alternative to sequential ICP and atomic absorption spectrometry for elemental analysis in condition monitoring.

The paper includes a complete explanation of basic ICP-OES principles and processes — from sample preparation to plasma generator to the optical system and detectors through to the software developed to interpret measurement data. Using the SPECTRO GENESIS simultaneous ICP-OES spectrometer as a test instrument, the paper references the typical limits of detection for related elements in condition monitoring. The paper also describes advantages of the SPECTRO GENESIS’ suitability for elemental analysis in condition monitoring and details its cost advantages versus sequential ICP and AAS analyzers.

Download “Cost-Effective Condition Monitoring” from SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry.