With the SPECTRO xSORT, SPECTRO XEPOS, and SPECTRO MIDEX X-ray fluorescence (XRF) spectrometers and the SPECTRO GENESIS and SPECTRO ARCOS ICP-OES spectrometers, SPECTRO offers efficient solutions for the analytical requirements for the determination of regulated substances in electrical and electronic equipment - for example according to the European Directive RoHS (Restriction of Hazardous Substances in Electrical and Electronic Equipment) and WEEE (Waste Electrical and Electronic Equipment).
The RoHS directive forbids the use of the hazardous metals cadmium, lead and mercury as well as hexavalent chromium and the brominated flame retardants containing PBB and PBDE. The WEEE directive simultaneously regulates the minimum quotas for the recycling and reuse of electrical and electronic waste, for which products containing low levels of harmful substances are an important prerequisite.
In the IEC 62321 with recommendations for suitable analytical procedures within the framework of the RoHS directive, the International Electrotechnical Commission describes X-ray fluorescence analysis, (XRF RoHS) with its minimal requirements for sample preparation, as being suited for fast quantitative screening. ICP-OES spectrometry, with its more complex but standardized sample preparation procedures, is also indicated as being an appropriate tool for quantitative elemental analysis.