Many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.

The SPECTRO MIDEX X-ray fluorescence spectrometer was developed for these requirements down to the finest details. With input from our customers, it has been extended and optimized. The result is a SPECTRO MIDEX, that sets new standards for analytical performance and ease of use.

Now in its third generation, the SPECTRO MIDEX X-ray fluorescence spectrometer has developed into an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up to double EC format, 233x160 mm, 9.2x6.3’’).