Working principle

ED-XRF Spectrometer, X-Ray Fluorescence, X-Ray Fluorescence Analysis

X-Ray fluorescence analysis using ED-XRF spectrometers is a commonly used technique for the identification and quantification of elements in a substance.

SPECTRO`s stationary ED-XRF spectrometers are based on the energy-dispersive-X-ray-fluorescence analysis method. The atoms in the sample material, which could be any solid, powder or liquid are excited by X-Rays emitted from an X-Ray tube or radioisotope. For increasing sensitivity, the primary excitation radiation can be polarized by using specific targets between the X-Ray tube and the sample (ED-P(polarization)-XRF). All element specific X-Ray fluorescence signals emitted by the atoms after the photoelectric ionization are measured simultaneously in a fixed mounted semi-conductor detector or sealed gas-proportional counter.

The radiation intensity of each element signal, which is proportional to the concentration of the element in the sample, is recalculated internally from a stored set of calibration curves and can be shown directly in concentration units.

Download schematics (PDF file) of the working principle