SPECTRO MIDEX

Small spot energy dispersive X-ray fluorescence (ED-XRF) spectrometer optimized for compliance testing, for element line scans and mappings

  • OVERVIEW +


    • The all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces
    • Widest scope of elements backed by extensive factory calibrations providing the best accuracy for traces and majors
    • Fastest measurement times: choose exceptional results at conventional measurement times, or conventional results at exceptional measurement times
    • Launched August, 2016
     
    The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.

    Accuracy of elemental analysis is often critical. For other applications speed is even more important. In addition, all users prefer analyzers that are easy to operate, with helpful software and easy transfer of results into a lab network. In many applications, users also prize nondestructive sampling.

    For years, SPECTRO MIDEX has turned in top-rated XRF performance. SPECTRO MIDEX incorporates the latest developments in ED-XRF detector technology, plus a greatly improved count rate. These smart new innovations help make it one of the most advanced midrange laboratory XRF benchtop analyzers available for small spot analyses and rapid mapping of large surfaces.
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