Unbeatable sensitivity and extreme precision for demanding applications

SPECTROGREEN with new revolutionary Dual Side-On Interface (DSOI) technology

DSOI provides twice the sensitivity of conventional radial-plasma-view instruments
New GigE readout system significantly boosts spectra processing and transport speeds
Extremely agile, LDMOS generator that makes external cooling unnecessary
New software delivers a simply intuitive ease-of-use

Where price and performance meet perfection

It can be this simple! A true alternative to AA and Sequential IP

A quantum leap in ICP-MS technology

Double focusing sector field mass spectrometer with newly developed ion optic and pioneering detector technology
Simultaneous measurement of the complete, inorganically relevant, mass range
Rapid fingerprinting and real-time internal standardization
Measurement of transient signals, isotope ratios and isotope dilution

High-Performance XRF Spectrometer for multi-elemental analysis

Advanced elemental analysis of major, minor, and trace element concentrations
Outstanding sensitivity and detection limits — yielding remarkable precision and accuracy
Different versions maximize performance for various applications

SPECTROCUBE ED-XRF analyzer for Precious Metals Testing

Fastest in its class: Twice as fast as typical testing, high precision in as little as 15 seconds
Excels in scope and accuracy: One analysis, 30+ elements — including traces
Unparalleled ease-of-use: Just three simple steps to accurate results

Small spot ED-XRF spectrometer optimized for precious metal testing

The market recognized gold standard for precious metals analysis
Widest scope of elements backed by extensive factory calibrations providing the best accuracy for traces and majors
Fastest measurement times: choose exceptional results at conventional measurement times, or conventional results at exceptional measurement times

All-round small spot XRF talent for single spot analyses, line scans and mappings

Fast, reliable, lab-grade analysis for field and at-line applications

Covers a wide range of elements for ppm to % concentrations
Convenient lightweight portability in a rugged, space-saving design
Available with customer-specific calibrations and advanced pre-calibrated application packages
Unique iCAL standardization process with an single integrated sample in less than 5 minutes

Family of SDD based handheld ED-XRF spectrometers

The market leading mobile metal analyzer

The easy choice when you can´t afford to make metal mistakes

SDD based handheld ED-XRF

Ultimate performance for the next generation of metal analysis

Metal analysis without compromise!

CCD-based, spark discharge, optical emission spectrometer
Precise analysis of all common metals for incoming inspection and foundry process control
Effective wavelength range: 140 - 670 nm
Rugged and reliable, available as benchtop or floor model

The highest performance and dependability at the lowest possible price

About SPECTRO

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AMETEK Materials Analysis Division - Information about the AMETEK Materials Analysis Division

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