Unbeatable sensitivity and extreme precision for demanding applications

High resolution simultaneous ICP-OES for elemental analysis of liquids
Wavelength range: 130-770 nm
Outstanding resolution
Intuitive operation

SPECTROGREEN with new revolutionary Dual Side-On Interface (DSOI) technology

DSOI provides twice the sensitivity of conventional radial-plasma-view instruments
TI technology enables highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices
New GigE readout system significantly boosts spectra processing and transport speeds
Extremely agile, LDMOS generator that makes external cooling unnecessary

It can be this simple! A true alternative to AA and Sequential IP

Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range: 175-770 nm
Low cost of ownership
Intuitive operation

High-Performance XRF Spectrometer for multi-elemental analysis

Advanced elemental analysis of major, minor, and trace element concentrations
Outstanding sensitivity and detection limits — yielding remarkable precision and accuracy
Different versions maximize performance for various applications

SPECTROCUBE ED-XRF Analyzer

Fastest in its class: Twice as fast as typical testing, high precision with high speed
Excels in scope and accuracy: Optimized application packages
Unparalleled ease-of-use: Just three simple steps to accurate results

Small spot ED-XRF spectrometer optimized for precious metal testing

The market recognized gold standard for precious metals analysis
Widest scope of elements backed by extensive factory calibrations providing the best accuracy for traces and majors
Fastest measurement times: choose exceptional results at conventional measurement times, or conventional results at exceptional measurement times

All-round small spot XRF talent for single spot analyses, line scans and mappings

Fast small spot elemental analysis
Flexible excitation spot size: 200 µm to 4 mm
Optional XYZ table for automated line scans and mappings
'Long Distance Mode' for irregular sample topography

Fast, reliable, lab-grade analysis for field and at-line applications

Covers a wide range of elements for ppm to % concentrations
Convenient lightweight portability in a rugged, space-saving design
Available with customer-specific calibrations and advanced pre-calibrated application packages
Unique iCAL standardization process with an single integrated sample in less than 5 minutes

Family of SDD based handheld ED-XRF spectrometers

All important elements from Mg to U in just a few seconds
Analyses, PMI, grade ID, sorting, environmental and compliance screening
Laboratory-like results for many applications in just a few seconds
Comprehensive safety features and functions

The market leading mobile metal analyzer

Short analysis times: 2 s in sorting mode and from 5 s in analysis mode
Carbon determination with arc and spark excitation
Analysis of C, P, S, N, B and other elements with UV probe
All probes suitable for arc and spark excitation
Unique iCAL 2.0: one-sample standardization of the entire system

The easy choice when you can´t afford to make metal mistakes

Effortless point-and-shoot performance
Breakthrough new self-adjusting optical system
Unique iCAL 2.0: one-sample standardization of the entire system
Simplified software with new plug-in extendability

SDD based handheld ED-XRF

All important elements from Mg to U in just a few seconds
Analyses, PMI, grade ID, sorting, environmental and compliance screening
Laboratory-like results for many applications in just a few seconds
Comprehensive safety features and functions

A True Revolution in High-End Metal Analysis

Highly accurate results
Low maintenance intervention requirements
Excellent detection limits
Instrument footprint reduced by 27%
iCAL 2.0 — one sample standardization for the complete system

Ultimate performance for the next generation of metal analysis

Two advanced versions: hybrid or all-CCD
Software-extendable configuration for utmost elemental flexibility
Ultra-low limits of detection
Ultra-high speed of measurement

Metal analysis without compromise!

Unique new iCAL 2.0 one sample standardization helps maintain the same standardization – regardless of most temperature shifts and saves on average 30 minutes per day
CCD-based, spark discharge, optical emission spectrometer
Precise analysis of all common metals for incoming inspection and foundry process control
Effective wavelength range: 140 - 670 nm

The highest performance and dependability at the lowest possible price

Worry-free analysis
Ultra-reliable results
Long-term availability
iCAL logic eliminates expensive recalibration
Best price/performance ratio

Our direct contact for journalists and publishers

Mr. Marco Buchholz
Marketing Communications Coordinator
Tel. + 49.(0)2821.892-2107
Fax + 49.(0)2821.892-2207
Email marco.buchholz@ametek.com

Mr. Thorsten Görtz
Marketing Communications Coordinator
Tel. + 49.(0)2821.892-2106
Fax + 49.(0)2821.892-2207
Email thorsten.goertz@ametek.com

Press

Press Contact

Our direct contact for journalists and publishers

JOIN THE CONVERSATION

Contact Us

Subscribe to Newsletter

Follow Us