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SPECTRO Offers a Full Range of X-Ray Fluorescence, ICP-OES, and ICP-MS Instruments Optimized for Geological Applications

Application Briefs and White Paper

Elemental analysis is one of the most important investigative tools in geology and environmental studies. Geological samples often contain a wide range of elements at vastly differing concentrations.

The SPECTRO Instrument catalog includes a full range of X-ray fluorescence, ICP-OES, and ICP-MS instruments with characteristics optimized for geological fieldwork. Energy Dispersive X-Ray Fluorescence (ED-XRF) spectrometers like SPECTRO XEPOS provide a convenient, rapid method of analysis for rocks, exploration samples, minerals, ores, concentrates and tailings, usually with far less sample preparation than that required for other techniques. The portable spectrometer SPECTROSCOUT is an ED-XRF spectrometer that incorporates much of the analytical power of top-grade laboratory bench-top analyzers, yet incredibly, this small portable spectrometer can deliver fast, dependable, true lab-quality results anywhere in the field.

ICP-OES spectrometers like the SPECTROBLUE and SPECTRO ARCOS and ICP-MS spectrometers like the SPECTRO MS have been used for a long time in geological applications. With a large number of samples, requirements for short analysis times, low detection limits, especially for the light elements, ICP-OES and MS provide the looked-for performance. Both techniques are easy to automate, enable detection limits in sub-ppm and ppb ranges and analyze a sample in less than 2 minutes.

ICP-MS is also widely used in isotope geochemistry in which the study of trace element concentrations and the relative abundances of their element isotopes is used for geological dating and for “fingerprinting” rocks and minerals. The SPECTRO MS is the first commercially available ICP-MS capable of true simultaneous mass spectrometry.