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SPECTRO Offers a Full Range of X-Ray Fluorescence, and ICP-OES Instruments Optimized for Geological Applications

Application Briefs and White Paper

Elemental analysis is one of the most important investigative tools in geology and environmental studies. Geological samples often contain a wide range of elements at vastly differing concentrations.

The SPECTRO Instrument catalog includes a full range of X-ray fluorescence, and ICP-OES instruments with characteristics optimized for geological fieldwork. Energy Dispersive X-Ray Fluorescence (ED-XRF) spectrometers like SPECTRO XEPOS provide a convenient, rapid method of analysis for rocks, exploration samples, minerals, ores, concentrates and tailings, usually with far less sample preparation than that required for other techniques. The portable spectrometer SPECTROSCOUT is an ED-XRF spectrometer that incorporates much of the analytical power of top-grade laboratory bench-top analyzers, yet incredibly, this small portable spectrometer can deliver fast, dependable, true lab-quality results anywhere in the field.

ICP-OES spectrometers like the SPECTROGREEN and SPECTRO ARCOS have been used for a long time in geological applications. With a large number of samples, requirements for short analysis times, low detection limits, especially for the light elements, ICP-OES and MS provide the looked-for performance. Both techniques are easy to automate, enable detection limits in sub-ppm and ppb ranges and analyze a sample in less than 2 minutes.