Conventional radial-view spectrometers lack the sensitivity to determine trace elements. Even new vertical-torch dual-view models are compromised by matrix interferences, contamination, and components’ thermal stress. But one new analyzer avoids these problems. Its innovative technology offers twice the sensitivity — with trouble-free simplicity. You get just what you want for routine environmental analysis, and beyond.
Watch our video: "SPECTROGREEN: Analyzer Innovation and Affordability - for Environmental Testing and More"
White paper: "Comparing ICP-OES Analyzers’ Plasma Views: Axial, Radial, Dual, MultiView, and New Dual Side-On Interface"