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The top-of-Line SPECTRO ARCOS ICP-OES analyzer evolves elemental analysis to the next level

New dual side-on interface (DSOI) adds sensitivity and eliminates contamination/matrix compatibility issues
One instrument instead of two: Only MultiView plasma instrument in the market ‒ true axial AND true radial (single or dual) plasma observation in one instrument
ORCA Optical System: Simultaneous spectrum capture in the 130-770 nm wavelength range with up to 5x more sensitivity than Echelle based systems ‒ delivers best in class performance in the UV/VUV range

SPECTROGREEN with new revolutionary Dual Side-On Interface (DSOI) technology

DSOI provides twice the sensitivity of conventional radial-plasma-view instruments
TI technology enables highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices
New GigE readout system significantly boosts spectra processing and transport speeds
Extremely agile, LDMOS generator that makes external cooling unnecessary

It can be this simple! A true alternative to AA and Sequential IP

High-Performance XRF Spectrometer for multi-elemental analysis

Advanced elemental analysis of major, minor, and trace element concentrations
Outstanding sensitivity and detection limits — yielding remarkable precision and accuracy
Different versions maximize performance for various applications

SPECTROCUBE ED-XRF Analyzer

Fastest in its class: Twice as fast as typical testing, high precision with high speed
Excels in scope and accuracy: Optimized application packages
Unparalleled ease-of-use: Just three simple steps to accurate results

Small spot ED-XRF spectrometer optimized for precious metal testing

The market recognized gold standard for precious metals analysis
Widest scope of elements backed by extensive factory calibrations providing the best accuracy for traces and majors
Fastest measurement times: choose exceptional results at conventional measurement times, or conventional results at exceptional measurement times

All-round small spot XRF talent for single spot analyses, line scans and mappings

Fast, reliable, lab-grade analysis for field and at-line applications

Covers a wide range of elements for ppm to % concentrations
Convenient lightweight portability in a rugged, space-saving design
Available with customer-specific calibrations and advanced pre-calibrated application packages
Unique iCAL standardization process with an single integrated sample in less than 5 minutes

Family of SDD based handheld ED-XRF spectrometers

The market leading mobile metal analyzer

The easy choice when you can´t afford to make metal mistakes

SDD based handheld ED-XRF

A True Revolution in High-End Metal Analysis

Ultimate performance for the next generation of metal analysis

Metal analysis without compromise!

Unique iCAL 2.0 one sample standardization helps maintain the same standardization — regardless of most temperature shifts and saves on average 30 minutes per day
Up to 64% reduced argon consumption during standby, compared to previous models
Extended wavelength range for the ability to analyze hydrogen and oxygen (example: titanium base)
Ideal for routine analysis and precise analysis of all incoming/outgoing materials and for process control (including nitrogen) in foundries — covering 10 matrices, 68 methods and 56 elements

The highest performance and dependability at the lowest possible price