Experience SPECTRO live – right here

Stay tuned… We will be streaming content every week. Please also take advantage of the on-demand content available on this page and in our resource library.

Click the live stream title to add to your calendar!
June 8 No Stream
June 12 XRF "Raw Materials Screening with SPECTRO XRF Ident Software"
June 15 ICP "ICP-OES Smart Background Correction for Complex Matrices"

The webinars will take place at 10 AM EDT (4 PM CEST). 

And don’t forget: You can always reserve an online, interactive, one-on-one product demonstration with one of our applications experts. 
On-Demand Content

On-Demand Webinar: Spark Spectrometer Using Full Spectrum Registration and Partial Integration of Spark Discharges

Webinar CMOSThis on-demand-webinar examines the possibility to combine the advantages of photomultipliers (PMT) and solid-state line detectors (CCD) by using SPECTRO's proprietary CMOS+T sensor technology.


On-Demand Webinar: ICP-OES Plasma Observation Technologies and Their Application

ICP-OES Plasma Observation Technologies and Their ApplicationThis webinar reviews the core concepts surrounding the optical interfaces that are available for ICP-OES spectrometers and discusses the relative strengths and weaknesses of each approach.


On-Demand Webinar: Five Reasons for Upgrading to a Next-Generation ED-XRF Analyzer

Five Reasons for Upgrading to a Next-Generation ED-XRF AnalyzerED-XRF instruments have made amazing strides in recent years. Quantum leaps in several technologies are making users rethink what’s possible with a modern analyzer.


On-Demand Webinar: SPECTROCUBE — ED-XRF Elemental Analysis Optimized for Your Application

SPECTROCUBE — ED-XRF Elemental Analysis Optimized for Your ApplicationThe new SPECTROCUBE ED-XRF analyzer delivers easy, reliable, accurate, high-throughput analysis for a variety of applications, e.g. analysis of precious metals, compliance screening or analysis of fuels and lube oils.


On-Demand Webinar: Is There an Alternative to the Classical Dual-View Technique?

Is There an Alternative to the Classical Dual-View Technique?Dual side-on interface (DSOI) technology — as seen in the SPECTROGREEN ICP-OES analyzer — puts the challenge of plasma viewing in a whole new light. Learn more in this informative webinar.


On-Demand Webinar: Which ICP-OES Optical Technology Offers Superior Performance: Echelle or ORCA?

Webinar Echelle vs ORCAThis presentation discusses key advantages and disadvantages of the two optical technologies echelle and ORCA based on the analytical objective of achieving either highest precision, maximum sensitivity, or both. The presentation explains the fundamental differences of each technology and how the optics of echelle and ORCA are matched to the detectors. It also discusses fundamental concepts such as light loss, stray light, spectral orders and how each can potentially affect the outcome of an analysis.


On-Demand Webinar: SPECTRO XEPOS ED-XRF Technology - A Quantum Leap

Webinar Quantum LeapGet an insider overview of these evolutionary developments in ED-XRF technology. Learn the benefits to users and why for many applications the new SPECTRO XEPOS is now able to challenge the performance of WD-XRF.


On-Demand Webinar: Advances In ED-XRF and ICP-OES Technology Improve Chemical and Petrochemical Analysis

Chemical & Petrochemical Analysis WebinarThis on-demand webcast concentrates on how users can have a drastic improvement on efficiency, performance, and speed. It shows how the application of high performance equipment can make the use of additional techniques obsolete, how sample-to-samples times can be reduced and how instrument operating costs can be minimized. 


On-Demand Webinar: Elemental Analysis of Liquid Petroleum Products With ICP-OES and ED-XRF Instruments

Analysis of Liquid PetroleumThis webinar provides an overview of the different elemental analysis techniques that can be used for petrochemical products using ICP-OES and ED-XRF instruments. The discussion includes a detailed description of the method setup for five applications using ICP-OES and ED-XRF instruments and provides test results for different petrochemical applications.


On-Demand Webinar: Future-Proof Solutions for Elemental Compliance Screening Using XRF

Webinar Elemental Compliance Screening Using XRFFortunately, analytical technology has kept pace with regulatory demands. Analyzers employing X-ray fluorescence (XRF) spectrometry have evolved excellent capabilities for rapid screening. This on-demand webinar gives an update on the requirements and shows the potential of modern XRF instrumentation.


White Paper

White Paper 4 Reasons to Upgrade to ICP-OES 

Four Reasons to Upgrade to Next-Generation ICP-OES Technology 

This new paper outlines the shortfalls that users experience with conventional ICP-OES analyzers and explains how and why next generation technology can substantially improve analytical performance while reducing laboratory costs and expenses.

WP 5 Reasons to Upgrade XRF 

Five Reasons for Upgrading to a Next-Generation ED-XRF Analyzer 

This paper may be of particular interest to laboratory and quality control (QC) managers. It highlights five main reasons why upgrading to next-generation ED-XRF analyzers may be their right choice to optimize performance, efficiency, and affordability.

Whitepaper PMT vs. CMOS 

PMT vs. CMOS: The Paradigm Shift in Metal Analyzer Detector Technologies 

This white paper details PMT issues as well as CMOS-based flexibility, sensitivity, stability, speed, and more. It outlines how SPECTRO’s proprietary CMOS+T technology brings the new SPECTROLAB S to a whole new level of metal analysis.